Non-parametric tests are used when standard assumptions are not available. These tests don’t rely on distributions, often ...

To address this challenge and enable manufacturers to quickly ramp capacity, Keysight has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

which is also known as the Wilcoxon signed rank sum test and the Wilcoxon matched pairs test, is a non-parametric statistical test used to compare two dependent samples (in other words, two groups ...

The Kruskal–Wallis test is a statistical test used to compare two or more groups for a continuous or discrete variable. It is a non-parametric test, meaning that it assumes no particular distribution ...