Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...
By applying machine learning techniques, engineers at MIT have created a new method for 3D printing metal alloys that produce ...
Abstract: Nowadays, visual object detection (VOD) is widely used in many AI applications, such as autonomous driving, intelligent robotics, and smart surveillance. As an essential postprocessing step ...
Play Bio Menace like it's 1993. Or at least, how your time-ravaged brain remembers it.
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