1). What’s new is the application of parallel techniques to semiconductor parametric test applications. Keithley Instruments pioneered the concept in the form of a synchronous parallel test capability ...

Non-parametric tests are used when standard assumptions are not available. These tests don’t rely on distributions, often ...

Lacking adequate parametric optical test capability, faults go undetected, assemblies are not interchangeable between weapon systems, and the repair pipeline becomes overloaded. Fiber-optic ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

To address this challenge and enable manufacturers to quickly ramp capacity, Keysight has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high ...

which is also known as the Wilcoxon signed rank sum test and the Wilcoxon matched pairs test, is a non-parametric statistical test used to compare two dependent samples (in other words, two groups ...

Available with up to 48 pins and eight source-measurement units, the next-generation 4080 Series parametric test platform from Agilent Technologies features resolution to 1 femtoamp and 0.1 microvolt.

The Kruskal–Wallis test is a statistical test used to compare two or more groups for a continuous or discrete variable. It is a non-parametric test, meaning that it assumes no particular distribution ...

The new Advantest Cloud Solutions (ACS) Dynamic Parametric Test (DPT) powered by PDF Exensio® solution is already being used in production by a large integrated device manufacturer. ACS is a ...