Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
The growing demand for Lithium-ion (Li-ion) batteries, driven by applications such as electric vehicles and long-duration energy storage, has increased the pressure on battery manufacturers to enhance ...
Intel and John Deere recently collaborated to pilot an AI solution utilizing computer vision to automatically spot and correct defects in its automated welding process. Together they developed an ...
A significant portion of semiconductor devices currently in production are classified as light-emitting diodes (LEDs). LEDs are the light of choice when it comes to most lighting applications, both ...
Machine learning-assisted metal additive manufacturing has been widely applied in performance optimization and control, such as process parameter optimization, structural optimization of formed parts, ...
What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...
Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural network (CNN) with ...
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