AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University report in Small Methods the 3D imaging of a suspended nanostructure. The technique used is an extension of atomic force ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

AFAM operates by exciting the sample with ultrasonic waves while simultaneously probing the surface with an AFM tip. The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these ...